A completely scalable lumped-circuit model for horizontal and vertical HALL devices

Abstract

A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results. © 2007 IEEE.