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A completely scalable lumped-circuit model for horizontal and vertical HALL devices

dc.creatorDimitropoulos, P. D.en
dc.creatorReymond, S.en
dc.creatorDrljaca, P. M.en
dc.creatorPopovic, R. S.en
dc.creatorNastos, N.en
dc.date.accessioned2015-11-23T10:25:39Z
dc.date.available2015-11-23T10:25:39Z
dc.date.issued2007
dc.identifier10.1109/ICSENS.2007.4388404
dc.identifier.isbn9781424412617
dc.identifier.isbn1424412617
dc.identifier.urihttp://hdl.handle.net/11615/27094
dc.description.abstractA completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results. © 2007 IEEE.en
dc.source.urihttp://www.scopus.com/inward/record.url?eid=2-s2.0-48349104937&partnerID=40&md5=fa892d6f32ffa767d5fff0ba93dfbb11
dc.subjectCircuit theoryen
dc.subjectDynamic responseen
dc.subjectGalvanomagnetic effectsen
dc.subjectHall effecten
dc.subjectHall effect devicesen
dc.subjectHall mobilityen
dc.subjectSensorsen
dc.subjectSPICEen
dc.subjectCircuit modelsen
dc.subjectExperimental datumsen
dc.subjectNoise behaviorsen
dc.subjectQuantitative analysesen
dc.subjectSimulation resultsen
dc.subjectMagnetic field effectsen
dc.titleA completely scalable lumped-circuit model for horizontal and vertical HALL devicesen
dc.typeconferenceItemen


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