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  •   University of Thessaly Institutional Repository
  • Επιστημονικές Δημοσιεύσεις Μελών ΠΘ (ΕΔΠΘ)
  • Δημοσιεύσεις σε περιοδικά, συνέδρια, κεφάλαια βιβλίων κλπ.
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  •   University of Thessaly Institutional Repository
  • Επιστημονικές Δημοσιεύσεις Μελών ΠΘ (ΕΔΠΘ)
  • Δημοσιεύσεις σε περιοδικά, συνέδρια, κεφάλαια βιβλίων κλπ.
  • View Item
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Bayesian annealed sequential importance sampling: An unbiased version of transitional Markov chain Monte Carlo

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Author
Wu S., Angelikopoulos P., Papadimitriou C., Koumoutsakos P.
Date
2018
Language
en
DOI
10.1115/1.4037450
Keyword
Chain length
Chains
Computer architecture
Markov processes
Monte Carlo methods
Parallel architectures
Uncertainty analysis
Bridge dynamics
Efficient sampling
Markov Chain Monte-Carlo
Parallel computing architecture
Parallel efficiency
Sequential importance sampling
Uncertainty quantifications
Wall collision
Importance sampling
American Society of Mechanical Engineers (ASME)
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Abstract
The transitional Markov chain Monte Carlo (TMCMC) is one of the efficient algorithms for performing Markov chain Monte Carlo (MCMC) in the context of Bayesian uncertainty quantification in parallel computing architectures. However, the features that are associated with its efficient sampling are also responsible for its introducing of bias in the sampling. We demonstrate that the Markov chains of each subsample in TMCMC may result in uneven chain lengths that distort the intermediate target distributions and introduce bias accumulation in each stage of the TMCMC algorithm. We remedy this drawback of TMCMC by proposing uniform chain lengths, with or without burn-in, so that the algorithm emphasizes sequential importance sampling (SIS) over MCMC. The proposed Bayesian annealed sequential importance sampling (BASIS) removes the bias of the original TMCMC and at the same time increases its parallel efficiency. We demonstrate the advantages and drawbacks of BASIS in modeling of bridge dynamics using finite elements and a disk-wall collision using discrete element methods. Copyright © 2018 by ASME.
URI
http://hdl.handle.net/11615/80818
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  • Δημοσιεύσεις σε περιοδικά, συνέδρια, κεφάλαια βιβλίων κλπ. [19735]
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