Εμφάνιση απλής εγγραφής

dc.creatorPapaioannou I., Papadimitriou C., Straub D.en
dc.date.accessioned2023-01-31T09:43:34Z
dc.date.available2023-01-31T09:43:34Z
dc.date.issued2016
dc.identifier10.1016/j.strusafe.2016.06.002
dc.identifier.issn01674730
dc.identifier.urihttp://hdl.handle.net/11615/77732
dc.description.abstractThis paper proposes the application of sequential importance sampling (SIS) to the estimation of the probability of failure in structural reliability. SIS was developed originally in the statistical community for exploring posterior distributions and estimating normalizing constants in the context of Bayesian analysis. The basic idea of SIS is to gradually translate samples from the prior distribution to samples from the posterior distribution through a sequential reweighting operation. In the context of structural reliability, SIS can be applied to produce samples of an approximately optimal importance sampling density, which can then be used for estimating the sought probability. The transition of the samples is defined through the construction of a sequence of intermediate distributions. We present a particular choice of the intermediate distributions and discuss the properties of the derived algorithm. Moreover, we introduce two MCMC algorithms for application within the SIS procedure; one that is applicable to general problems with small to moderate number of random variables and one that is especially efficient for tackling high-dimensional problems. © 2016 Elsevier Ltd.en
dc.language.isoenen
dc.sourceStructural Safetyen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84974574302&doi=10.1016%2fj.strusafe.2016.06.002&partnerID=40&md5=509513e15f85886f8f8742c490139a97
dc.subjectImportance samplingen
dc.subjectReliabilityen
dc.subjectStructural analysisen
dc.subjectHigh dimensionsen
dc.subjectHigh-dimensional problemsen
dc.subjectMCMCen
dc.subjectPosterior distributionsen
dc.subjectProbability of failureen
dc.subjectSequential importance samplingen
dc.subjectSimulation methoden
dc.subjectStructural reliability analysisen
dc.subjectReliability analysisen
dc.subjectElsevier B.V.en
dc.titleSequential importance sampling for structural reliability analysisen
dc.typejournalArticleen


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Εμφάνιση απλής εγγραφής