| dc.creator | Paliaroutis G.I., Tsoumanis P., Evmorfopoulos N., Dimitriou G., Stamoulis G.I. | en |
| dc.date.accessioned | 2023-01-31T09:41:22Z | |
| dc.date.available | 2023-01-31T09:41:22Z | |
| dc.date.issued | 2019 | |
| dc.identifier | 10.1109/MOCAST.2019.8741538 | |
| dc.identifier.isbn | 9781728111841 | |
| dc.identifier.uri | http://hdl.handle.net/11615/77435 | |
| dc.description.abstract | Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the problem. Thus, the evaluation of Soft Error Rate (SER) in the presence of multiple transient faults is necessary, since it remains an open research field. This tool is based on Monte-Carlo simulations and, in combination with the implementation of the masking mechanisms and the consideration of placement information, provides an accurate SER estimation. © 2019 IEEE. | en |
| dc.language.iso | en | en |
| dc.source | 2019 8th International Conference on Modern Circuits and Systems Technologies, MOCAST 2019 | en |
| dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85068579514&doi=10.1109%2fMOCAST.2019.8741538&partnerID=40&md5=c0311f99c481ef2703c7ba0ce611a943 | |
| dc.subject | Intelligent systems | en |
| dc.subject | Radiation hardening | en |
| dc.subject | Temperature | en |
| dc.subject | CMOS technology | en |
| dc.subject | Combinational logic | en |
| dc.subject | Radiation-induced | en |
| dc.subject | Sensitive regions | en |
| dc.subject | Ser estimations | en |
| dc.subject | Soft error rate | en |
| dc.subject | Transient faults | en |
| dc.subject | vulnerability | en |
| dc.subject | Monte Carlo methods | en |
| dc.subject | Institute of Electrical and Electronics Engineers Inc. | en |
| dc.title | Multiple Transient Faults in Combinational Logic with Placement Considerations | en |
| dc.type | conferenceItem | en |