Multiple Transient Faults in Combinational Logic with Placement Considerations

Abstract

Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the problem. Thus, the evaluation of Soft Error Rate (SER) in the presence of multiple transient faults is necessary, since it remains an open research field. This tool is based on Monte-Carlo simulations and, in combination with the implementation of the masking mechanisms and the consideration of placement information, provides an accurate SER estimation. © 2019 IEEE.