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dc.creatorMyridakis D., Spathoulas G., Kakarountas A., Schinianakis D., Lueken J.en
dc.date.accessioned2023-01-31T09:02:46Z
dc.date.available2023-01-31T09:02:46Z
dc.date.issued2019
dc.identifier10.1109/DCOSS.2019.00058
dc.identifier.isbn9781728105703
dc.identifier.urihttp://hdl.handle.net/11615/76859
dc.description.abstractThe rapid growth of connected devices and the sensitive data they generate poses a significant challenge for manufacturers seeking to comprehensively protect their devices from attack. This paper presents a study and its results from the correlation of the supply current of a smart device to its functional characteristics in order to detect a manufacturing or an operational anomaly. This concept was originated from the fact that most of the available smart devices in the market (connected to the Internet, establishing thus the so-called Internet of Things - IoT), are Application Specific devices thus having limited functionality. Issues on IoT applications, urging for solutions, are security, availability, and reliability. Awareness of the typical operation of a smart device in terms of operation and functionality may prove valuable, since any deviation may warn for an operational or functional anomaly. In this paper, the deviation (either increase or decrease) of the supply current is exploited for this reason. This work aims to affect the intrusion detection process for IoT and proposes for consideration new inputs of interest with a collateral interest of study. The results present 100% of attack detection. © 2019 IEEE.en
dc.language.isoenen
dc.sourceProceedings - 15th Annual International Conference on Distributed Computing in Sensor Systems, DCOSS 2019en
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85071904945&doi=10.1109%2fDCOSS.2019.00058&partnerID=40&md5=caf667b3ea17ca190ec2564c50133826
dc.subjectAnomaly detectionen
dc.subjectDistributed computer systemsen
dc.subjectHardware securityen
dc.subjectIntrusion detectionen
dc.subjectManufactureen
dc.subjectApplication specificen
dc.subjectAttack detectionen
dc.subjectCurrent monitoringen
dc.subjectFunctional characteristicsen
dc.subjectIOT applicationsen
dc.subjectPhysical characteristicsen
dc.subjectSecurity enhancementsen
dc.subjectSmart devicesen
dc.subjectInternet of thingsen
dc.subjectInstitute of Electrical and Electronics Engineers Inc.en
dc.titleMonitoring supply current thresholds for smart device's security enhancementen
dc.typeconferenceItemen


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