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CAS-HtBase: a new database for the study of HTs at the pre-silicon stage of ASICs

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Auteur
Liakos K.G., Plessas F.C.
Date
2022
Language
en
DOI
10.1109/PACET56979.2022.9976350
Sujet
Application specific integrated circuits
Electric network analysis
Hardware security
Machine learning
Malware
Silicon
Timing circuits
Viruses
Application-specific integrated circuits
Benchmark circuit
Chip-level
Encrypted informations
Gate levels
Gate-level netlist
Machine learning models
Netlist
Original design
Performance
Database systems
Institute of Electrical and Electronics Engineers Inc.
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Résumé
Hardware Trojan (HT) consists a chip-level viruses which aim to leak encrypted information or degrade the performance of the infected device. They are a modification to the original design of a circuit and consist of two components, trigger, and payload. The trigger is the mechanism that calls the payload under rare conditions. The payload mechanism is responsible for the type of attack the infected circuit will receive. HTs can be inserted into any phase of the Application-Specific Integrated Circuits (ASICs) production chain. They can stay stealthy and be undetected. HTs viruses are a crucial issue in the field of electronics, with the potential to become an outbreak in the next years. A major problem is that, at the academic and research level, there is a general lack of data, a lack of uninfected benchmark circuits, a lack of the small type of uninfected and infected circuits, and a large imbalance in the amount of data between uninfected and infected circuits. We used and designed these limited benchmark circuits for the Gate Level Netlist (GLN) phase with a professional tool and extracted area, power, and time analysis features. Through these features, we created a synthetic data creation tool known as GAINESIS through which we created our CAS-HtBase. CAS-HtBase aims to provide the researchers with a new HT database based on GLN analysis exclusively for ASICs. The format of CAS-HtBase allows the development of Machine Learning (ML) models without conversions to the database. © 2022 IEEE.
URI
http://hdl.handle.net/11615/75817
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  • Δημοσιεύσεις σε περιοδικά, συνέδρια, κεφάλαια βιβλίων κλπ. [19735]
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