Εμφάνιση απλής εγγραφής

dc.creatorKolomvatsos K., Anagnostopoulos C.en
dc.date.accessioned2023-01-31T08:43:44Z
dc.date.available2023-01-31T08:43:44Z
dc.date.issued2021
dc.identifier10.1109/ICICS52457.2021.9464571
dc.identifier.isbn9781665433518
dc.identifier.urihttp://hdl.handle.net/11615/75012
dc.description.abstractThe combination of the Internet of Things and the Edge Computing gives many opportunities to support innovative applications close to end users. Numerous devices present in both infrastructures can collect data upon which various processing activities can be performed. However, the quality of the outcomes may be jeopardized by the presence of outliers. In this paper, we argue on a novel model for outliers detection by elaborating on a 'soft' approach. Our mechanism is built upon the concepts of candidate and confirmed outliers. Any data object that deviates from the population is confirmed as an outlier only after the study of its sequence of magnitude values as new data are incorporated into our decision making model. We adopt the combination of a sliding with a landmark window model when a candidate outlier is detected to expand the sequence of data objects taken into consideration. The proposed model is fast and efficient as exposed by our experimental evaluation while a comparative assessment reveals its pros and cons. © 2021 IEEE.en
dc.language.isoenen
dc.source2021 12th International Conference on Information and Communication Systems, ICICS 2021en
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85111625043&doi=10.1109%2fICICS52457.2021.9464571&partnerID=40&md5=3c8de158758229b90791b6dbd41348b4
dc.subjectDecision makingen
dc.subjectPopulation statisticsen
dc.subjectComparative assessmenten
dc.subjectData objectsen
dc.subjectDecision making modelsen
dc.subjectExperimental evaluationen
dc.subjectIts sequencesen
dc.subjectOutliers detectionen
dc.subjectPervasive applicationsen
dc.subjectProcessing activityen
dc.subjectData communication systemsen
dc.subjectInstitute of Electrical and Electronics Engineers Inc.en
dc.titleLandmark based Outliers Detection in Pervasive Applicationsen
dc.typeconferenceItemen


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