Εμφάνιση απλής εγγραφής

dc.creatorGeorgakidis C., Sotiriou C., Sketopoulos N., Krstic M., Schrape O., Breitenreiter A.en
dc.date.accessioned2023-01-31T07:40:13Z
dc.date.available2023-01-31T07:40:13Z
dc.date.issued2020
dc.identifier10.1109/ISVLSI49217.2020.00065
dc.identifier.isbn9781728157757
dc.identifier.issn21593469
dc.identifier.urihttp://hdl.handle.net/11615/72044
dc.description.abstractFaults caused by ionising radiation have become a significant reliability issue in modern ICs. However, the Radiation Hardening (RADHARD) design flow differs from the standard design flow. Thus, there is not sufficient support from industrial EDA tools. In this work, we present a Triple Modular Redundancy (TMR) Radiation Hardening (RADHARD) methodology, based on the replacement of Flip-Flops (FFs) to a TMR structure, consisting of a FF triplet and a majority voter, as well as a custom, Displacement-driven legalisation algorithm, called R-Abax, able to satisfy user-specified, minimum distances between the FFs of each triplet. Our RADHARD legalisation algorithm is fully compatible with existing EDA tools. By ensuring a minimum spacing between triplet FFs of each TMR structure, we reduce the probability of a particle strike affecting more than one triplet instances. We present the impact of our RADHARD flow, for a set of spacing constraints, to Power, Performance and Area (PPA) on a set of 11 OpenCores benchmarks. On average, a larger spacing between FF triplets worsens a design's Quality-of-Results (QoR), but not significantly, making our RADHARD flow attractive for reducing radiation faults. © 2020 IEEE.en
dc.language.isoenen
dc.sourceProceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSIen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85090409011&doi=10.1109%2fISVLSI49217.2020.00065&partnerID=40&md5=c971d90a3f26397e9fa93aa1031131d4
dc.subjectAuthenticationen
dc.subjectBenchmarkingen
dc.subjectContractsen
dc.subjectElectronic design automationen
dc.subjectFault tolerant computer systemsen
dc.subjectFlip flop circuitsen
dc.subjectHardeningen
dc.subjectIonizing radiationen
dc.subjectVLSI circuitsen
dc.subjectA-particlesen
dc.subjectDesign flowsen
dc.subjectFully compatibleen
dc.subjectMajority voteren
dc.subjectMinimum distanceen
dc.subjectQuality of resultsen
dc.subjectStandard design flowen
dc.subjectTriple modular redundancyen
dc.subjectRadiation hardeningen
dc.subjectIEEE Computer Societyen
dc.titleR-Abax: A radiation hardening legalisation algorithm satisfying TMR spacing constraintsen
dc.typeconferenceItemen


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