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Πλοήγηση ανά Θέμα "Wafer maps"

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    • Wafer Map Defect Pattern Recognition using Imbalanced Datasets 

      Tziolas T., Theodosiou T., Papageorgiou K., Rapti A., Dimitriou N., Tzovaras D., Papageorgiou E. (2022)
      The accurate and automatic inspection of wafer maps is vital for semiconductor engineers to identify defect causes and to optimize the wafer fabrication process. This research work seeks to address the pattern recognition ...