Πλοήγηση ανά Θέμα "Transients"
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On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies
(2021)Soft errors constitute a crucial reliability concern for the Integrated Circuits (ICs) as the continuous CMOS technology downscaling renders them vulnerable to radiation-induced hazards. Therefore, the Soft Error Rate (SER) ... -
SER analysis of multiple transient faults in combinational logic
(2016)In the VLSI field, reliability of chips is a major issue and it becomes more significant considering the continuous technology down-scaling. Modern chips are extremely sensitive to various factors such as radiation and, ... -
Single Event Transients Generation and Propagation Flow using Commercial EDA Tools
(2021)The ever increasing demand for reliable microelectronic systems in the presence of radiation, combined with the continuous shrinking of CMOS technologies, has rendered the impact of radiation-induced voltage glitches, known ...