Πλοήγηση ανά Θέμα "Stresses analysis"
Αποτελέσματα 1-2 από 2
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Accelerating Electromigration Stress Analysis Using Low-Rank Balanced Truncation
(2022)Electromigration (EM) has become one of the most significant challenges considering longterm reliability in integrated circuit design. The problem is caused by the large current density in circuit interconnections. However, ... -
A novel semi-analytical approach for fast electromigration stress analysis in multi-segment interconnects
(2022)As integrated circuit technologies move below 10 nm, Electromigration (EM) has become an issue of great concern for the longterm reliability due to the stricter performance, thermal and power requirements. The problem of ...