Sfoglia per Soggetto "Radiation-induced"
Items 1-5 di 5
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Multiple Transient Faults in Combinational Logic with Placement Considerations
(2019)Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the ... -
A Placement-Aware Soft Error Rate Estimation of Combinational Circuits for Multiple Transient Faults in CMOS Technology
(2019)A considerable disadvantage that comes with the downscaling of the CMOS technology is the ever-increasing susceptibility of Integrated Circuits (ICs) to soft errors. Therefore, the study of the radiation-induced transient ... -
Placement-based SER estimation in the presence of multiple faults in combinational logic
(2017)Susceptibility of modern ICs to radiation-induced faults constitutes a matter of great concern in the recent years. Particularly, the transient faults and their impact on the combinational logic remain an intriguing issue, ... -
Single Event Transients Generation and Propagation Flow using Commercial EDA Tools
(2021)The ever increasing demand for reliable microelectronic systems in the presence of radiation, combined with the continuous shrinking of CMOS technologies, has rendered the impact of radiation-induced voltage glitches, known ... -
The use of radiobiological parameters and the evaluation of NTCP models. How do they affect the ability to estimate radiation induced complications?
(2009)Normal Tissue Complication Probability (NTCP) models currently used, provide a simplified representation of the clinical radiobiology since there are number of radiobiological mechanisms which affect the clinical outcome ...