Πλοήγηση ανά Θέμα "Electrical masking"
Αποτελέσματα 1-1 από 1
-
On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies
(2021)Soft errors constitute a crucial reliability concern for the Integrated Circuits (ICs) as the continuous CMOS technology downscaling renders them vulnerable to radiation-induced hazards. Therefore, the Soft Error Rate (SER) ...