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Parcourir par sujet "CMOS technology"

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    • Multiple Transient Faults in Combinational Logic with Placement Considerations 

      Paliaroutis G.I., Tsoumanis P., Evmorfopoulos N., Dimitriou G., Stamoulis G.I. (2019)
      Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the ...

    • Single Event Transients Generation and Propagation Flow using Commercial EDA Tools 

      Simoglou S., Georgakidis C., Lilitsis I., Sotiriou C., Andjelkovic M., Krstic M. (2021)
      The ever increasing demand for reliable microelectronic systems in the presence of radiation, combined with the continuous shrinking of CMOS technologies, has rendered the impact of radiation-induced voltage glitches, known ...