Listar por tema "Transient faults"
Mostrando ítems 1-7 de 7
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Design of Reconfigurable Fault-Tolerant Datapaths
(2020)In this paper, behavioral-level synthesis techniques are presented for the design of reconfigurable hardware. The techniques are applicable for synthesis of several classes of designs, such as design for fault-tolerance ... -
A Layout-Based Soft Error Rate Estimation and Mitigation in the Presence of Multiple Transient Faults in Combinational Logic
(2020)Cosmic radiation resulting in transient faults to the combinational logic of Integrated Circuits (ICs), constitutes a major reliability concern for space applications. In addition, continuous technology shrinking allows ... -
Multiple Transient Faults in Combinational Logic with Placement Considerations
(2019)Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the ... -
On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies
(2021)Soft errors constitute a crucial reliability concern for the Integrated Circuits (ICs) as the continuous CMOS technology downscaling renders them vulnerable to radiation-induced hazards. Therefore, the Soft Error Rate (SER) ... -
Placement-based SER estimation in the presence of multiple faults in combinational logic
(2017)Susceptibility of modern ICs to radiation-induced faults constitutes a matter of great concern in the recent years. Particularly, the transient faults and their impact on the combinational logic remain an intriguing issue, ... -
Radiation Hardening Legalisation Satisfying TMR Spacing Constraints with Respect to HPWL
(2020)Reduction in device feature sizes and supply voltage renders modern Integrated Circuits (ICs) more susceptible to Soft Errors (SEs), i.e. Transient Faults caused by ionising radiation. Moreover, the RADiation HARDening ... -
SER analysis of multiple transient faults in combinational logic
(2016)In the VLSI field, reliability of chips is a major issue and it becomes more significant considering the continuous technology down-scaling. Modern chips are extremely sensitive to various factors such as radiation and, ...