Browsing by Subject "Soft error rate"
Now showing items 1-3 of 3
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A Layout-Based Soft Error Rate Estimation and Mitigation in the Presence of Multiple Transient Faults in Combinational Logic
(2020)Cosmic radiation resulting in transient faults to the combinational logic of Integrated Circuits (ICs), constitutes a major reliability concern for space applications. In addition, continuous technology shrinking allows ... -
Multiple Transient Faults in Combinational Logic with Placement Considerations
(2019)Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the ... -
On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies
(2021)Soft errors constitute a crucial reliability concern for the Integrated Circuits (ICs) as the continuous CMOS technology downscaling renders them vulnerable to radiation-induced hazards. Therefore, the Soft Error Rate (SER) ...