Browsing by Author "Paliaroutis G.I., Tsoumanis P., Evmorfopoulos N., Dimitriou G., Stamoulis G.I."
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Multiple Transient Faults in Combinational Logic with Placement Considerations
Paliaroutis G.I., Tsoumanis P., Evmorfopoulos N., Dimitriou G., Stamoulis G.I. (2019)Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the ... -
A Placement-Aware Soft Error Rate Estimation of Combinational Circuits for Multiple Transient Faults in CMOS Technology
Paliaroutis G.I., Tsoumanis P., Evmorfopoulos N., Dimitriou G., Stamoulis G.I. (2019)A considerable disadvantage that comes with the downscaling of the CMOS technology is the ever-increasing susceptibility of Integrated Circuits (ICs) to soft errors. Therefore, the study of the radiation-induced transient ...