Εμφάνιση απλής εγγραφής

dc.creatorSimoglou S., Sotiriou C., Blias N.en
dc.date.accessioned2023-01-31T09:56:13Z
dc.date.available2023-01-31T09:56:13Z
dc.date.issued2021
dc.identifier10.1109/DFT52944.2021.9568296
dc.identifier.isbn9781665416092
dc.identifier.issn25761501
dc.identifier.urihttp://hdl.handle.net/11615/78986
dc.description.abstractIn this paper, we demonstrate that conventional Static Timing Anaysis (STA) based, functional, gate-level simulation of asynchronous circuits with cycles is only as accurate as the STA engine used. This is, firstly because cycle cuts create local slew errors at cutpoints, and secondly because slew propagation may not be upper bounded across multiple cut points in the same cycle. The use of an Asynchronous STA (ASTA) engine, which does not cut cycles, and properly bounds slews across cycles is a possible solution, which can indeed serve as an upper bound over SPICE transistor level similations. We contrast STA and ASTA-based gate-level simulations with transistor level SPICE simulations to demonstrate the impact of timing errors for 12 asynchronous control circuits, implemented by the Petrify tool, in a 0.25µm technology library. We show that STA-based simulation results are incorrectly more optimistic than ASTA, and it is possible for the simulation period to even be faster than SPICE, which is a major timing error. © 2021 IEEEen
dc.language.isoenen
dc.sourceProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85142418453&doi=10.1109%2fDFT52944.2021.9568296&partnerID=40&md5=f48571d8686c5e06414c19b244a55e53
dc.subjectEnginesen
dc.subjectErrorsen
dc.subjectTiming circuitsen
dc.subjectAsynchronous circuitsen
dc.subjectCut-pointen
dc.subjectFunctional gatesen
dc.subjectGate level simulationen
dc.subjectSimulation erroren
dc.subjectSPICE simulationsen
dc.subjectStatic timing analysisen
dc.subjectTiming errorsen
dc.subjectTransistor levelen
dc.subjectUpper Bounden
dc.subjectSPICEen
dc.subjectInstitute of Electrical and Electronics Engineers Inc.en
dc.titleStatic Timing Analysis Induced Simulation Errors for Asynchronous Circuitsen
dc.typeconferenceItemen


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