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Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing

dc.creatorPapageorgiou E.I., Theodosiou T., Margetis G., Dimitriou N., Charalampous P., Tzovaras D., Samakovlis I.en
dc.date.accessioned2023-01-31T09:43:00Z
dc.date.available2023-01-31T09:43:00Z
dc.date.issued2021
dc.identifier10.1109/IISA52424.2021.9555499
dc.identifier.isbn9781665400329
dc.identifier.urihttp://hdl.handle.net/11615/77667
dc.description.abstractZero Defect Manufacturing (ZDM) can be described as the set of methodologies and strategies for the elimination of defective components during production, and is one of the main goals of Industry 4.0. ZDM is very appealing to industries grace to the reduction of operational costs associated with defective components. Efficient defect detection in modern production lines may benefit from Artificial Intelligence (AI) technologies in numerous stages of the manufacturing process. This paper presents a short review of AI technologies employed during product inspection and quality assessment. Indicative applications are reported to demonstrate that AI in its many flavors may be efficiently integrated into production environments and pave the way towards ZDM. © 2021 IEEE.en
dc.language.isoenen
dc.sourceIISA 2021 - 12th International Conference on Information, Intelligence, Systems and Applicationsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85117490544&doi=10.1109%2fIISA52424.2021.9555499&partnerID=40&md5=b27c682747e5fb568381ed5b8f44bf83
dc.subjectArtificial intelligenceen
dc.subjectDefectsen
dc.subjectInternet of thingsen
dc.subjectManufactureen
dc.subject% reductionsen
dc.subjectArtificial intelligence technologiesen
dc.subjectArtificial intelligenten
dc.subjectDefect detectionen
dc.subjectIntelligent technologyen
dc.subjectManufacturing ISen
dc.subjectProduction lineen
dc.subjectQuality assessmenten
dc.subjectZero defect manufacturingen
dc.subjectZero defectsen
dc.subjectComputer visionen
dc.subjectInstitute of Electrical and Electronics Engineers Inc.en
dc.titleShort Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturingen
dc.typeconferenceItemen


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