Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing
dc.creator | Papageorgiou E.I., Theodosiou T., Margetis G., Dimitriou N., Charalampous P., Tzovaras D., Samakovlis I. | en |
dc.date.accessioned | 2023-01-31T09:43:00Z | |
dc.date.available | 2023-01-31T09:43:00Z | |
dc.date.issued | 2021 | |
dc.identifier | 10.1109/IISA52424.2021.9555499 | |
dc.identifier.isbn | 9781665400329 | |
dc.identifier.uri | http://hdl.handle.net/11615/77667 | |
dc.description.abstract | Zero Defect Manufacturing (ZDM) can be described as the set of methodologies and strategies for the elimination of defective components during production, and is one of the main goals of Industry 4.0. ZDM is very appealing to industries grace to the reduction of operational costs associated with defective components. Efficient defect detection in modern production lines may benefit from Artificial Intelligence (AI) technologies in numerous stages of the manufacturing process. This paper presents a short review of AI technologies employed during product inspection and quality assessment. Indicative applications are reported to demonstrate that AI in its many flavors may be efficiently integrated into production environments and pave the way towards ZDM. © 2021 IEEE. | en |
dc.language.iso | en | en |
dc.source | IISA 2021 - 12th International Conference on Information, Intelligence, Systems and Applications | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85117490544&doi=10.1109%2fIISA52424.2021.9555499&partnerID=40&md5=b27c682747e5fb568381ed5b8f44bf83 | |
dc.subject | Artificial intelligence | en |
dc.subject | Defects | en |
dc.subject | Internet of things | en |
dc.subject | Manufacture | en |
dc.subject | % reductions | en |
dc.subject | Artificial intelligence technologies | en |
dc.subject | Artificial intelligent | en |
dc.subject | Defect detection | en |
dc.subject | Intelligent technology | en |
dc.subject | Manufacturing IS | en |
dc.subject | Production line | en |
dc.subject | Quality assessment | en |
dc.subject | Zero defect manufacturing | en |
dc.subject | Zero defects | en |
dc.subject | Computer vision | en |
dc.subject | Institute of Electrical and Electronics Engineers Inc. | en |
dc.title | Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing | en |
dc.type | conferenceItem | en |
Files in this item
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |