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Πλοήγηση ανά Συγγραφέα "Antoniadis C., Garyfallou D., Evmorfopoulos N., Stamoulis G."

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    • EVT-based worst case delay estimation under process variation 

      Antoniadis C., Garyfallou D., Evmorfopoulos N., Stamoulis G. (2018)
      Manufacturing process variation in sub-20nm processes has introduced ever increasing overhead in Static Timing Analysis (STA) in order to guarantee the reliable operation of the circuit. Chip designers apply corner-based ...