Listar por autor "Tsoumanis P., Paliaroutis G.-I., Evmorfopoulos N., Stamoulis G."
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On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies
Tsoumanis P., Paliaroutis G.-I., Evmorfopoulos N., Stamoulis G. (2021)Soft errors constitute a crucial reliability concern for the Integrated Circuits (ICs) as the continuous CMOS technology downscaling renders them vulnerable to radiation-induced hazards. Therefore, the Soft Error Rate (SER) ...