Sfoglia per Soggetto "Approximation errors"
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Accelerating Electromigration Stress Analysis Using Low-Rank Balanced Truncation
(2022)Electromigration (EM) has become one of the most significant challenges considering longterm reliability in integrated circuit design. The problem is caused by the large current density in circuit interconnections. However, ... -
Efficient Hotspot Thermal Simulation Via Low-Rank Model Order Reduction
(2018)Efficient full-chip thermal simulation is among the most challenging problems facing the EDA industry today, due to the need for solution of very large systems of equations that require unreasonably long computational ... -
Efficient IC hotspot thermal analysis via low-rank Model Order Reduction
(2019)Efficient full-chip thermal simulation is among the most challenging problems facing the EDA industry today, due to the need for solution of very large systems of equations that require unreasonably long computational ...